Zeiss Microscopy are organising a webinar on “Application of Ultra-short Pulsed Lasers for Improved Microscopy Sample Preparation” by Cheryl Hartfield of Zeiss Microscopy on 29th March 2022 at 10:00 (UK time)
The emergence of ultra-short, pulsed lasers for sample preparation opens new possibilities for sample preparation in materials characterisation and failure analysis. This webinar will provide an overview of different sample preparation strategies for high resolution imaging and analysis, with application examples showcasing new capabilities enabled by a FIB-SEM with integrated fs (femto-second) laser.
This session is designed for those working in Electronics Materials Characterisation, Electronics Failure Analysis and Electronics Packaging, with key learnings including:
- Introduction to cross-section techniques
- Review of mechanical methods, BIB, FIB-SEM, ex-situ USP lasers, integrated laser FIB-SEM
- LaserFIB applications and technique comparisons
Speaker Profile – Cheryl Hartfield
Cheryl Hartfield is Product Marketing Manager for ZEISS Microscopy, based in Dublin, California. She received her MA and BS in Microbiology from UT Southwestern Medical Center and Texas A&M respectively. She co-founded Omniprobe and was Senior Member of Technical Staff at Texas Instruments, working for 12 years in characterisation and package development. Cheryl is an ASM Fellow and Past President of EDFAS. She has 15 patents and authored >70 papers.
To register for the webinar, click HERE