IMAPS-UK Technical Showcase: Probing Failure Analysis Techniques by Greg Johnson, ZEISS Microscopy – 9 May 2022
Probing Failure Analysis Techniques for Devices and Packages by Greg Johnson, ZEISS Microscopy
Click on the above heading to listen and view the presentation made on 9 May 2022. It lasts approximately 45 minutes.
If you require a copy of the presentation, you can download it below:
