ZEISS Webinar – One-probe Nanoprobing of Power Devices and Electronic Packages – Thursday 24th October 2024

ZEISS Microscopy is organising a webinar on “One-probe Nanoprobing of Power Devices and Electronic Packages” by Andrew Elliott on Thursday 24th October 2024 at 13:00 – 14:00 (UK (BST) time)

The rapid growth of SiC (Silicon Carbide) devices in the power and automotive industries is driving the need for advanced techniques in semiconductor analysis. Join our exclusive webinar to gain insights into the unique combinations of Electron Beam Induced Current (EBIC) and Passive Voltage Contrast (PVC), and how these methods provide complimentary data essential for thorough junction analysis.

Dr. Andrew Elliott will delve into a case study where commercially available SiC MOSFET devices were cross sectioned with a Crossbeam FIB-SEM in preparation for characterisation. PVC highlighted the electron affinity or work function of various implant regions of the surface, showing strong contrasts between p and n regions. In contrast, EBIC is an image of the beam current response to electric fields associated with the depletion zones of a p/n junction. Depletion zones were easily characterised in the EBIC data.

Join us on Thursday 24th October 2024 for an informative session and Q&A. Register today to attend or to receive the webinar recording by email.

To register for the webinar, click HERE

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