Following the Centre for Power Electronics (CPE) Annual Conference held on 13-15 July 2021, IMAPS-UK and CPE have organised an Extra-Time session on “3D Techniques for Non-Destructive and Destructive Failure Analysis” by Greg Johnson of Zeiss Microscopy.
This is a free to join event, please log in or register below to book a place.
3D Techniques for Non-Destructive and Destructive Failure Analysis
Greg Johnson, Zeiss Microscopy
Complete understanding of packaging and device failures require physical characterisation of the precise element that is failing. The choice of the appropriate non-destructive and destructive technique for fault isolation and failure analysis can be very challenging. This webinar will review the latest 3D techniques used for non-destructive and destructive failure analysis of electronics to provide an understanding of the method, but also the limitations of each technique in assessing possible flaws and failures.
Once registered, you will receive Joining Instructions by e-mail 1-2 days before the event. Bookings can be accepted up to 1 hour prior to the event start
Book Event Tickets
When booking the event, please ensure that the Delegate Name is included on the booking form, if you are not the person attending. Please note that the person booking the event will be the only person who will have access to event booking history and be able to download any event materials .
Bookings are now closed for this event. - Please contact the IMAPS-UK office for further details
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Date(s) - 02/09/2021
2:00 pm - 3:00 pm
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