The ninth IMAPS-UK Online Tutorial Session is “Nano-Surgery and Failure Analysis” by Lloyd Peto of Nanoscope Services Ltd.
This is a free to join event, please log in or register below to book a place.
This is the ninth in a series of Fundamentals of Electronics Packaging Tutorials organised by IMAPS-UK (International Microelectronics, Assembly and Packaging Society) to describe various aspects of the production and assessment of micro-electronic assemblies.
Nano-Surgery and Failure Analysis
Lloyd Peto – Nanoscope Services Ltd
Learn how Focused Ion Beam (FIB) can be used to cut and connect metal nodes on prototype semiconductor devices to correct design faults without the expense of mask re-manufacture before volume manufacture.
Lloyd Peto – Commercial Director and Senior Engineer
Physicist, business man and marketeer, who has worked at Rutherford Appleton, FEI Company Europe (UK, Holland and Germany), FEI Company USA (twice), Micrion Corporation (DE and UK), Raith GmbH (DE) and NanoScope Services Ltd (UK). He has developed many FIB and microscopy applications (like TEM sample preparation and Cryo DualBeam for Life Sciences), helped develop instruments, managed sales teams and driven market development strategies. Lloyd is a co-founder and director of NanoScope.
Once registered, you will receive Joining Instructions by e-mail 2-3 days before the event. Bookings can be accepted up to 2 hours prior to the event start
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When booking the event, please ensure that the Delegate Name is included on the booking form, if you are not the person attending. Please note that the person booking the event will be the only person who will have access to event booking history and be able to download any event materials .
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Date(s) - 18/09/2020
1:00 pm - 1:45 pm
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