The eighth IMAPS-UK Online Tutorial Session is “Electron Microscopy and Materials Characterisation for Electronic Packaging” by Stuart Robertson of Loughborough University.
This is a free to join event, please log in or register below to book a place.
This is the eighth in a series of Fundamentals of Electronics Packaging Tutorials organised by IMAPS-UK (International Microelectronics, Assembly and Packaging Society) to describe various aspects of the production and assessment of micro-electronic assemblies.
Electron Microscopy and Materials Characterisation for Electronic Packaging
Stuart Robertson – Loughborough University
Characterisation of the detailed interactions of materials used in micro-electronic assembly requires specialised equipment and procedures. This tutorial will provide a brief introduction to the principles of Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) including contrast types and some practical advice on collecting Energy Dispersive Spectroscopy (EDS) data for lead free solder materials. This will be followed by a case study which highlights the applications of Plasma FIB 3D reconstruction, EDS and Electron Backscatter Detection (EBSD) for understanding the degradation of nano silver sintered die attach following power cycling.
Stuart attained a MEng in materials and design at Loughborough University, followed by a PhD at Loughborough University focused on the micromechanical testing of ceramics using FIB, SEM and TEM.
Following his PhD he took up a Research Associate position based in the electrical interconnects research group in the Wolfson School of Engineering. His current role of LMCC research associate involves supporting Ion beam and in-situ microscopy across the department and wider School/University and with external consultancy within the Loughborough Materials Characterisation Centre (LMCC).
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Date(s) - 04/09/2020
1:00 pm - 1:45 pm
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