This IMAPS-UK Online Technical Showcase is “Probing Failure Analysis Techniques for Device and Package” by Greg Johnson of ZEISS Microscopy.
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Probing Failure Analysis Techniques for Device and Package
Greg Johnson – ZEISS Microscopy
Probing is on the Rise! Probing has gained momentum with new applications in semiconductor manufacturing and development, from device to package. Probing techniques such as nanoprobing, Electron Beam Induced Current (EBIC), Electron Beam Induced Resistance CHange (EBIRCH), as well as methods enabled by Atomic Force Microscopy (AFM) have become increasingly important parts of the failure analysis toolkit.
Greg Johnson – Senior Applications Development Engineer, ZEISS Microscopy
This talk will be given by Greg Johnson of ZEISS Microscopy, a failure analysis engineer with 19 U.S. patents and decades of experience in defect localisation and semiconductor process development. Among the topics covered will be a review of the 2021 IPFA Best FA Paper, “Low-Voltage EBIC Investigation of Fails”. The talk will cover low stress ways to characterise transistors and will also look to some applications for packaging.
Registration details (name/organisation) will be shared with the ZEISS Microscopy, please e-mail the IMAPS-UK Office, if you have any objections to this.
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Once registered, you will receive Joining Instructions by e-mail 2-3 days before the event. Bookings can be accepted up to 1 hour prior to the event start
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Date(s) - 09/05/2022
1:00 pm - 2:00 pm
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